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March 18,2024

Chroma ATE to Showcase AI Semiconductor Test Solutions atSEMICON China 2024
Behind Every SEMICONDUCTOR Breakthrough
Chroma ATE is gearing up to participate in SEMICON China 2024, where the company will showcase arange of innovative semiconductor test solutions focused on tackling the ever-evolving needs in AI, HighPerformance Computing (HPC), automotive, and AIoT applications.

RF Chip Test Solutions
The Chroma 3680/3380/3300 ATE Test Systems integrate the ADIVIC MP5806S, providing a complete RFchip test solution successfully validated for mass production through broad customer adoption. FeaturingS Parameter & Noise Figure functions for comprehensive testing of components such asFEM/PA/Switch/LNA, the systems support IoT communication standards such as Bluetooth, Wi-Fi, NB-IoT,GPS/BeiDou, and Tuner applications, with ultra-wideband VSG/VSA modules covering 300K-6GHz. The3680 HDRF2, launched in 2024, brings even higher integration to the MP5806 and 3680, featuring 32 RFports, 4 VST RF functions, and the capability to provide a multi-site and direct-mount RF test solution.

Advanced SoC/Analog Test Solutions
The Chroma 3650-S2 SoC/Analog Test System meets today's high voltage, high current, and complexdigital control requirements for power IC testing. Offering up to 768 power or digital I/O pins, up to 3000Vor 320A power supply capability, 200Mbps data rate, and 300ps EPA, this is an ideal choice for testinglithium battery management ICs, power management ICs (PMIC), and GaN and SiC-related power ICs.
The Chroma 3680 Advanced SoC Test System effectively meets the testing needs of cutting-edge chipsused in Artificial Intelligence (AI) and automotive technologies. This system offers up to 2048 digitalchannels, data rates up to 1Gbps, and support for up to 16G SCAN vector storage depth. High-precisionAD/DA test modules with 110dB SNR and -120dBc THD are available, as well as various test modules forconcurrent digital pattern, parametric measurement unit (PMU), device power supply (DPS), memory,mixed signal (AWG and digitizer), and RF signal testing.

Ultra-Low Temperature Test Solution
The Chroma A310002 Ultra-Low-Temperature Test System offers a stable Tri-Temp test temperature rangeof -70 to 150℃ and a power dissipation capacity of up to 1,000W, ideal for a range of rigorous temperaturetests. Combined with the Chroma 3200 Versatile SLT Test Platform, it provides a multi-station SLT testplatform for use in production lines, and can be paired with the CVOT (Chroma Virtual Operation Tools)software tool for easy access to production information and yield optimization. Chroma's ultra-lowtemperature test solution can meet the needs of industries such as automotive semiconductor ICs, AI anddata centers, graphics processors (GPU), accelerated processing units (APU), high-performance computing(HPC), aerospace, and defense. Designed to ensure that chips can operate without issues in harshenvironments, this is an optimal choice for product reliability testing.

2D/3D Wafer Metrology Systems
Chroma 7980 and 7981 are designed for precise and nanoscale 2D/3D measurement of critical dimensions(CD). Powered by Chroma's patented measurement integration technology BLiSTM, these systems achievesub-nanometer resolution. 7980 and 7981 provide algorithms and UI developed specifically for advancedpackaging applications, integrating specially designed platforms to achieve high-speed measurement andrapid auto-focus, non-contact surface profile analysis; they also feature large-area stitching capability tomeet various application needs. Already successfully adopted by various industry-leading customers,Chroma 7980 and 7981 offer a proven solution for applications such as TSV/VIA, RDL, Probe Mark, Overlay,Sub-μm, Surface Profile, and more.
SEMICON China 2024 will be held from March 20-22 at the Shanghai New International Expo Center. Makesure to drop by Chroma's Booth N4631 in Hall N4 to experience the latest breakthroughs in test andmeasurement technology. We look forward to connecting with you.